Open/short-circuit inspection at minimum 0.1 mm pitch
We manufacture conventional contact jigs using sockets (receptacles) for easy probe replacement and fine pitch jigs (T-160 specification*) with a laminated structure for 4-wire testing.
We offer probing designs for through-hole testing on multi-layer boards and for milli-ohm testing on copper foil patterns.
For through-hole testing, the probing design enables low-resistance inspection to detect copper plating defects on the hole wall.
For milli-ohm testing on copper foil patterns, the probing design is based on the pattern distance and width.
* The T-160 specification is a proprietary jig structure of Ohnishi Electronics.
Specifications
Manufacturing example (Size and weight will vary depending on specifications.)
Product name
Bare board test jig
Type
BB (PWB: printed wiring board)
Size
370 × 670 × 90 mm
Weight
9 kg
Applications
We also offer test jigs for bare boards (to detect open and short circuits in copper foil patterns) and withstand voltage testing of aluminum and copper circuit boards for lighting equipment.
Various engineering plastics, such as Bakelite and acrylic, are used as materials for the test jig depending on what is being inspected.
The T-160 specification has a socketless jig structure, which enables inspection of fine pitch patterns (probe pitch 0.1 mm).
